X-ray absorption spectroscopy (NEXAFS)
A table-top plasma source combined with a soft x-ray spectrometer is being used for analysis of the near-edge x-ray absorption fine structure (NEXAFS) of thin samples within the “water window”, ranging from λ = 2.2 nm ... 4.4 nm. The fine structure of the absorption edges yields information on molecular orbitals, oxidation states and the coordination of an absorbing element, and can therefore be applied for chemical analysis. Due to the high absorption coefficient of the radiation the technique is extremely surface-sensitive. Single-pulse NEXAFS spectra are obtained from a broad-band Krypton plasma, transmitted through a sample and divided by a reference spectrum without the sample.
Data acquired for various organic (polymers, lipids, humic acids, etc.) and inorganic (e.g. iron minerals) samples indicate excellent agreement with synchrotron measurements (Cooperations with G. A. Univ. Göttingen, MPI f. biophys. Chemie, within the SFB 755).
Product flyer NEXAFS spectrometer (PDF)
C. Peth et al:
“Near-edge x-ray absorption fine structure measurements using a laboratory-scale XUV source,“ J. Phys. D: Appl. Phys. 41 (2008)
F.-C. Kühl et al:
“Near-edge x-ray absorption fine structure spectroscopy at atmospheric pressure with a table-top laser-induced soft x-ray source,” J. Vac. Sci. Technol. A 34 (2016)
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