Soft X-ray absorption spectroscopy and microscopy
A table-top plasma source combined with a soft x-ray spectrometer is being used for analysis of the near-edge x-ray absorption fine structure (NEXAFS) of thin samples (e.g. C, N, O, Ca, K, Ti, Mn, Fe) within the “water window”, ranging from λ = 2.2 nm ... 4.4 nm. The fine structure of the absorption edges yields information on molecular orbitals, oxidation states and the coordination of an absorbing element, and can therefore be applied for chemical analysis.
Table-top NEXAFS-Spektrometer
Additionally, in the department Optics / Short Wavelengths a compact laboratory x-ray microscope is developed for the “water window” spectral range (λ = 2.2 nm … 4.4 nm) achieving a spatial resolution of about 50 nm. Applications range from structural analysis in biology and life sciences.
Siemens star imaged with soft x-ray radiation at wavelength 2.88 nm
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Laser-Laboratorium Göttingen e.V. (LLG)
Contact person:
Head of department
Dr. Klaus Mann
"Optics / Short Wavelengths"
Tel.: +49(0)551/5035-41
FAX: +49(0)551/5035-99
kmann(at)llg-ev.de