Beam profiler / caustic scan measurements
Modern applications in laser technology demand a comprehensive characterization of the utilized light sources. Thus, the department of Optics / Short Wavelengths offers high precision techniques for determination of the spatial profile as well as standard methods for relevant beam parameters for more than 20 years. For this purpose camera-based systems have been developed in order to measure the near-filed and far-field intensity profiles allowing to determine the beam parameters according to latest ISO standards (ISO 11146, ISO 13694, and ISO 15367).
• Beam analysis (NIR, Vis, UV, EUV, soft x-rays)
• Beam parameters according to ISO standards
• Beam propagation
• Pointing stability
• M2 (setup for caustic measurement)
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