X-ray absorption spectroscopy (NEXAFS)
A table-top plasma source combined with a soft x-ray spectrometer is being used for analysis of the near-edge x-ray absorption fine structure (NEXAFS) of thin samples within the “water window”, ranging from λ = 2.2 nm ... 4.4 nm. The fine structure of the absorption edges yields information on molecular orbitals, oxidation states and the coordination of an absorbing element, and can therefore be applied for chemical analysis. Due to the high absorption coefficient of the radiation the technique is extremely surface-sensitive. Single-pulse NEXAFS spectra are obtained from a broad-band Krypton plasma, transmitted through a sample and divided by a reference spectrum without the sample.

Schematics and photo of NEXAFS spectrometer based on table-top soft x-ray source
Data acquired for various organic (polymers, lipids, humic acids, etc.) and inorganic (e.g. iron minerals) samples indicate excellent agreement with synchrotron measurements (Cooperations with G. A. Univ. Göttingen, MPI f. biophys. Chemie, within the SFB 755).

NEXAFS spectrum of PCMO acquired with table-top soft x-ray source. The single peaks correspond to electronic transitions in unoccupied molecular orbitals and represent chemical structure and bonds of the sample
Further information:
Product flyer NEXAFS spectrometer (PDF)
C. Peth et al:
“Near-edge x-ray absorption fine structure measurements using a laboratory-scale XUV source,“ J. Phys. D: Appl. Phys. 41 (2008)
F.-C. Kühl et al:
“Near-edge x-ray absorption fine structure spectroscopy at atmospheric pressure with a table-top laser-induced soft x-ray source,” J. Vac. Sci. Technol. A 34 (2016)
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Laser-Laboratorium Göttingen e.V. (LLG)
Contact person:
Head of department
Dr. Klaus Mann
"Optics / Short Wavelengths"
Tel.: +49(0)551/5035-41
FAX: +49(0)551/5035-99
kmann(at)llg-ev.de